AZOM

Advanced SEM Sample Preparation for Traditional and Air-sensitive Materials

insights from industryBrandon Van Leer & Eric GoergenSr. Product Marketing ManagersThermo Fisher Scientific In this interview, AZoM speaks with Brandon Van Leer, Sr. Product Marketing Manager, and ...
AZoNano

Improving SEM Sample Preparation With Broad Ion Beam Milling

Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...
AZOM

Sample Preparation for SEM Imaging

insights from industryDr. Anna WalkiewiczApplications SpecialistQuorum Technologies In this interview, AZoM talks to Anna Walkiewicz, Applications Specialist at Quorum Technologies, about sample ...
AZoNano

EM ACE600 Sputter Coater: Sample Preparation of Thin Films

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure With the EM ACE600 sputter coater, users ...
Michigan Technological University

Hitachi S-4700 FE-SEM

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...
SpaceRef

Video: Ticks Survive and Move in Extreme Environment Inside an Electron Microscope

Observation of Live Ticks (Haemaphysalis flava) by Scanning Electron Microscopy under High Vacuum Pressure, PLoS One “Scanning electron microscopes (SEM), which image sample surfaces by scanning with ...